• 15:15-15:40

How to measure the invisible. Latest SIOS developments in the field of nanometrology.

Today's technological developments follow a common trend in many manufacturing industries: Products are becoming more complex and powerful, the demands on manufacturing quality are increasing, while components and object structures are becoming smaller and smaller.
The increasing industrial use of micro- and nanotechnological objects leads in turn to ever higher demands on measurement technology.
Peter Grundschok, Sales Manager of SIOS Meßtechnik GmbH, will give an insight into how the latest SIOS measuring systems can be used to measure precisely and accurately down to the nanometer range. He will give information about the latest product developments and application possibilities up to individual OEM solutions in the field of nanometrology.