Future technological progress follows a common trend in many industry sectors: Products are becoming more complex and powerful, the demand on manufacturing quality is increasing continuously.
On the other hand, components and object structures are becoming smaller and smaller which leads to new metrological challenges. The increasing use of micro- and nanotechnological objects requires new methods of contactless measurement technologies.
Peter Grundschok, Sales Manager of SIOS Meßtechnik GmbH, will provide an insight view into how the latest SIOS measuring systems can be used to measure highly precisely in combination with resolutions below the nanometer range. I addition I will give information about individual OEM solutions for feedback applications and latest product developments in the field of nanometrology.