• 14:00-14:25
  • Lectures hall 3

Inspection and Metrology: A short overview of stylus and WLI technique for measuring industry applications

  • Dr. Thomas Carlier
  • Bruker Nano Surfaces & Metrology

Almost a century ago the concept of measuring surface roughness started as a way to stop disputes and uncertainty between buyers and manufacturers.
Today, it is a common identifier that is utilized across industry for confirming adherence to both internal and regulatory specifications, validating manufacturing processes, and guaranteeing performance and quality of end products.
This presentation will focus on the essential role of Bruker's metrology technology, and in particular WLI technique in understanding and characterising next-generation industrial product from automotive industry through high tech optical industry to MEMS & thin films.